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FPGA时延故障测试技术研究的中期报告AbstractInthismid-termreport,wepresentthecurrentprogressofourresearchonFPGAdelayfaulttestingtechnique.First,weprovideabriefsummaryofthebackgroundandmotivationofthisresearch.Then,wereviewtherelatedworkinthefield.Next,wedescribethedetaileddesignofourproposeddelayfaulttestingmethodology.Finally,wepresenttheexperimentalresultsobtainedfromourapproachanddiscusstheimplicationsoftheseresults.BackgroundandMotivationFieldProgrammableGateArray(FPGA)hasbecomeapopularchoiceforimplementingdigitalcircuitsduetoitsflexibilityandreconfigurability.However,theincreasingcomplexityofFPGAcircuitshasmadethedetectionanddiagnosisofdefectsachallengingtask.Delayfaultsareacommontypeofdefectthatcancausesignificantperformancedegradationorevenfailureofthesystem.Therefore,thedevelopmentofefficientandeffectivedelayfaulttestingtechniquesforFPGAsisofgreatimportance.TheprimarymotivationofthisresearchistoproposeadelayfaulttestingmethodologythatcanbeusedfortestingFPGAs,whichishighlyefficient,accurate,andrequiresaminimalhardwareoverhead.Inaddition,theproposedapproachshouldbeabletodetectbothcombinationalandsequentialdelayfaultsinthecircuit.RelatedWorkSeveralapproacheshavebeenproposedforFPGAdelayfaulttesting,whichcanbebroadlyclassifiedintogate-levelandRTL-leveltesting.Thegate-levelapproachinvolvesgeneratingatest-benchforthegate-levelmodeloftheFPGAcircuit,whichrequiressignificanteffortsintermsofgate-levelsimulationandverification.Ontheotherhand,theRTL-levelapproachusesahigh-levelmodeloftheFPGAcircuit,whichcanbeusedtogeneratetestvectorsforthecircuitwithminimalsimulationtime.However,mostoftheexistingapproachessufferfromlowfaultcoverageorhighhardwareoverhead.ProposedMethodologyToaddressthelimitationsofexistingapproaches,weproposeanewdelayfaulttestingmethodologythatcombinesthestrengthsofbothgate-levelandRTL-levelapproaches.TheproposedapproachinvolvestakingadvantageoftheexistingRTL-leveltestbenchandaugmentingitwithadditionalfaultsimulationlogic.Theproposedmethodologyconsistsofseveral