宁夏大学新华学院本科学位论文PAGE\*MERGEFORMAT43智能芯片测试系统的开发与设计摘要随着计算机技术和微电子技术的迅速发展，智能芯片测试系统的应用越来越广泛。测试过程应用于智能芯片的制造过程，其主要目的都是为智能芯片质量与可靠性提供一种度量。本文介绍了智能芯片测试的重要地位，分析了芯片测试系统的发展和现状，提出了相应的设计方案。系统选择美国NI公司的数据采集卡（NI-DAQ）PCI-6221对待测参数进行采集，应用LabVIEW编程语言对该测试系统的控制部分以及结果比对部分进行了设计，最终实现了一个闭环的测试系统的设计并给出测试结果，主要用D/A芯片来实现设计。与传统的测试方法相比，设计更开放与灵活，便于修改，成功的实现了数字端口的控制，模拟量的采集以及结果的比对与显示。关键字：虚拟仪器，LabVIEW，数据采集AbstractWiththerapiddevelopmentofthecomputertechnologyandmicroelectronicstechnology,Smartchip-testingsystemsareusedmorewidely.Thetestingprocessareusedinsmartchipprocess,Mainpurposeistoprovideameasureforsmartchipqualityandreliability.Thearticleintroducestheimportantroleofthesmartmicrochiptestingandanalyzesthechiptestsystemdevelopmentandsituation.Italsoputsforwardthecorrespondingdesignscheme.ThesystemusesdataacquisitioncardtocollectthemeasuringparametersandchooseAmericaNIcompany’sdatacollectioncard(DAQ)MseriesNI-models:PCI6221foracquisitionsignalequipment,appliestheLabVIEWprogrammingsoftwareforthetestsystemsoftwareparts,thecontrolpartsandtheresult.TheLabVIEWrealizesthedesignofclosedlooptestingsystemandgivesouttheresults,MainlyuseD/Achiptoimplementthedesign.Comparedwiththetraditionaltestmethods,itismoreopenandflexible,easytomodify.Itmakesthedesignofdigitalcontrolports,analogcaptureandcompareanddisplaytheresultssucceed.Keywords:HYPERLINK"app:ds:virtual%20instrument"\t"_self"virtualinstrument，LabVIEWElectromagneticinterference，Dataacquisition.目录第一章前沿································································11.1课题背景及研究意义················································11.1.1现代工业生产的热点研究···········································11.1.2测试系统设计技术的产生···········································21.2研究意义···························································21.3D/A芯片测试方法发展现状·········································31.4课题研究内容和研究方法···········································3第二章总体方案设计·······················································52.1选用的D/A芯片测